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Additional info for Advances in Electronics and Electron Phisics. Vol. 43

Sample text

Because of the convolution operation indicated in Eq. , by a geometrical point but rather by a light distribution represented by B[( - L/A)x, ,( - L/A)y,] whose spreading on the plane of the transform is inversely proportional to the aperture b(x,, y , ) of the optical system. B[( - L / A ) x , , (- L/A)y,] itself can thus be considered a measure of the indeterminancy with which a point on the output plane of the optical system represents a spatial frequency present in the spectrum of the input signal because of the finite dimensions of the elements of the optical system itself.

92 ............. 99 ............. D. Ferroelectric Media .................................. VII. Electron-Optical Systems ............................................ 112 112 ...................... 135 ents ......... I. INTRODUCTION The promise of the electron beam as a means of addressing large quantities of digital information with high speed and low systems cost has intrigued many workers since the early days of modern computing machines. The major advantage of any beam memory, whether photons, electrons, or * Present address: HP Laboratories, Hewlett-Packard Company, 1501 Page Mill Road, Palo Alto, California, 94304.

The amplitude transmittance of the micrograph has a phase 0 not related to the information contained by the contrast on the micrograph itself. d. The optical density and the contrast of the micrograph (Zeitler and Hayes, 1965; Valentine, 1969) are subjected to fluctuations which are due to the statistical distribution of the electrons. , of the F C i , as can be seen from a discussion of the factors just mentioned. 1. Optical Analysis of Electron Microscopic Data The modulus I a, 1 of the complex amplitude transmittance is defined in such a way that i, = (a,12i, (46) where io and i, are respectively the intensity of the incident light and that of the light transmitted from the micrograph.

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